To further enhance our leadership position in counterfeit detection and avoidance, North Shore Components offers as a value added service the OKOS MicroVue three-axis digital inspection system for semiconductor package integrity assessment.

The compact, portable OKOS MicroVue is a multi-lingual, all digital, ultra high resolution, high sensitivity ultrasonic inspection system for conducting material and package integrity measurements and inspections. The MicroVue system features:

Mechanical:

• Servo on scan axis
• 1.5 m/s max scan velocity
• +/- 0.5 micron accuracy & repeatability
• 0.5 micron data resolution
• Dual JEDEC trays

Fixtures:

• Simple JEDEC tray fixture
• Through-transmission transducer fixture

Sub Systems:

• High frequency digital pulser-receiver
• Display
• Operator-friendly multi-touch
• Dual LCD monitors

To learn more about the OKOS Microvue three-axis digital inspection system for assessing semiconductor package integrity, contact us today.

Okos MicroVue Semiconductor Inspection System Datasheet